Drift mobility measurements in a-C:H films by time-resolved electroluminescenceFOULANI, A.Applied surface science. 2002, Vol 202, Num 3-4, pp 206-210, issn 0169-4332, 5 p.Article

An interpretation of reverse current in metal/intrinsic diamond/semiconducting diamond junction diodesHUANG, Qing-An; DAYOU SUN; SIN, Johnny K. O et al.Applied surface science. 2001, Vol 171, Num 1-2, pp 57-62, issn 0169-4332Article

The leakage current mechanism of PZT thin films deposited by in-situ sputteringHWANG, Y. S; PAEK, S. H; MAH, J. P et al.Journal of materials science letters. 1996, Vol 15, Num 12, pp 1030-1031, issn 0261-8028Article

Photoinduced electron transfer involving localized electronic statesNEWMARK, A. R; STIMMING, U.Electrochimica acta. 1987, Vol 32, Num 8, pp 1217-1221, issn 0013-4686Article

Field-enhanced electronic transport in solidsDALLACASA, V; PARACCHINI, C.Physical review. B, Condensed matter. 1986, Vol 34, Num 12, pp 8967-8970, issn 0163-1829Article

A transient Poole-Frenkel effect at the semiconductor surface of MAOS devicesKLIEM, H; ARLT, G.Solid-state electronics. 1983, Vol 26, Num 12, pp 1183-1188, issn 0038-1101Article

THE POOLE-FRENKEL EFFECT IN THE MODEL OF CHARGED DANGLING BONDSKAHNT H; SCHIRRMEISTER F; FELTZ A et al.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 57; NO 2; PP. K183-K185; BIBL. 13 REF.Article

Generalized Poole Frenkel (PF) effect with donors distributed in energyONGARO, R; PILLONNET, A.Revue de physique appliquée. 1989, Vol 24, Num 12, pp 1097-1110, issn 0035-1687, 14 p.Article

Poole-Frenkel (PE) effect high field saturationONGARO, R; PILLONNET, A.Revue de physique appliquée. 1989, Vol 24, Num 12, pp 1085-1095, issn 0035-1687, 11 p.Article

THE TEMPERATURE AND COMPENSATION DEPENDENCE OF THE THRESHOLD VOLTAGE FOR SWITCHING EFFECT DUE TO THE POOLE-FRENKEL AND SCREENING EFFECTS WITH APPLICATION TOCHROMIUM DOPED GAAS STRUCTURESHRIVNAK L'; DUBECKY F.1980; ACTA PHYS. SLOV.; CSK; DA. 1980; VOL. 30; NO 3; PP. 233-241; ABS. RUS; BIBL. 9 REF.Article

EFFET POOLE-FRENKEL DANS LE MONOXYDE DE SILICIUM DOPE.PINGUET J; MINN SS.1976; SOLID STATE COMMUNIC.; G.B.; DA. 1976; VOL. 19; NO 5; PP. 451-454; BIBL. 20 REF.Article

CHARGE RETENTION OF MNOS DEVICES LIMITED BY FRENKEL-POOLE DETRAPPING.LEHOVEC K; FEDOTOWSKY A.1978; APPL. PHYS. LETTERS; U.S.A.; DA. 1978; VOL. 32; NO 5; PP. 335-338; BIBL. 12 REF.Article

ON THE DISCHARGE OF ELECTRETSWESEMEYER H; HELLSTROEM S.1977; ERICSSON TECH.; SWE; DA. 1977 PUBL. 1978; VOL. 33; NO 3; PP. 219-246; BIBL. 16 REF.Article

THE CONDUCTION PROCESS IN PYROLYTICALLY DEPOSITED SIO₂ FILMS.POPOVA LI; ANTOV BZ; VITANOV PK et al.1976; THIN SOLID FILMS; NETHERL.; DA. 1976; VOL. 38; NO 3; PP. 247-253; BIBL. 11 REF.Article

What is behind the √E?DUNLAP, D. H; KENKRE, V. M; PARRIS, P. E et al.The Journal of imaging science and technology. 1999, Vol 43, Num 5, pp 437-443, issn 1062-3701Article

Poole-Frenkel conductivity prior to electroforming in evaporated Au-SiO_x-Au sandwich structuresGOULD, R. D; LOPEZ, M. G.Thin solid films. 1999, Vol 343-4, pp 94-97, issn 0040-6090Conference Paper

Electrical characteristics of oxide-nitride-oxide films formed on tunnel-structured stacked capacitorsMATSUO, N; SASAKI, A.I.E.E.E. transactions on electron devices. 1995, Vol 42, Num 7, pp 1340-1343, issn 0018-9383Article

On the Poole-Frenkel constantTOROK, M. I.Physica status solidi. B. Basic research. 1984, Vol 126, Num 1, pp K97-K99, issn 0370-1972Article

Symmetry and electronic properties of the oxygen thermal donor in pulled siliconHENRY, P. M; FARMER, J. W; MEESE, J. M et al.Applied physics letters. 1984, Vol 45, Num 4, pp 454-456, issn 0003-6951Article

Poole-Frenkel centres in dielectrics. Kind and space density in plasma-polymerized organosilicon filmsTYCZKOWSKI, J; KRYSZEWSKI, M.Physica status solidi. A. Applied research. 1983, Vol 78, Num 1, pp 259-265, issn 0031-8965Article

Poole-Frenkel currents in thermally grown SiO₂ filmsKRAUSE, H.Physica status solidi. A. Applied research. 1982, Vol 74, Num 2, pp K151-K154, issn 0031-8965Article

Hole Transport in Diketopyrrolopyrrole (DPP) Small Molecules: A Joint Theoretical and Experimental StudyZI LI; XU ZHANG; YUAN ZHANG et al.Journal of physical chemistry. C. 2013, Vol 117, Num 13, pp 6730-6740, issn 1932-7447, 11 p.Article

Analysis of leakage mechanisms and leakage pathways in intra-level Cu interconnectsNGWAN, V. C; CHUNXIANG ZHU; KRISHNAMOORTHY, Ahila et al.IEEE international reliability physics symposium. 2004, pp 571-572, isbn 0-7803-8315-X, 1Vol, 2 p.Conference Paper

Observation of Poole-Frenkel effect saturation in SiO₂ and other insulating filmsHARRELL, W. R; FREY, J.Thin solid films. 1999, Vol 352, Num 1-2, pp 195-204, issn 0040-6090Article

The problem of deriving the field-induced thermal emission in Poole-Frenkel theoriesONGARO, R; PILLONNET, A.Radiation effects and defects in solids. 1992, Vol 124, Num 3, pp 289-300, issn 1042-0150Article